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EM TXP
EM TXP ·
LE
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Catalog No: EM TXP
Category: Objective Finder
Brand: Leica Microsystems
Description
EM TXP is a mechanical crosssectioning device that precisely downsizes samples for visual inspection. With EM TXP you can optimize sample prepreparation to minimize ion beam milling time and ensure creation of mirrorlike surfaces for light microscopy inspection.
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