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High-Resolution Scanning Probe Microscopes Comparison
GENERAL CATALOGUE

High-Resolution Scanning Probe Microscopes Comparison

NSA-3080 · 1 EA

Shimadzu · Cat: NSA-3080

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Catalog No: NSA-3080
Category: Surface Analysis
Pack Size: 1 EA
Brand: Shimadzu

Description

Summary of Product Features​ Comparison Table​ Videos​​ 1. Summary of Product Features​ SPM-9700HT Plus​​ High-Throughput Scanner Shortens Observation Times​​ • Image data is acquired 5 times faster than that of conventional product (SPM-9700HT).​ Ease of Operation Minimizes Distraction from Observation to Analysis​​ • Navigation function and other features ensure observations can be performed quickly and smoothly.​​ Functionality and Expandability to Meet a Wide Range of Requirements​ • A generous selection of measurement modes and excellent expandability help ensure reliable measurements.​​ SPM-Nanoa​​​​ Automatic Observation • Adjusts laser beam, and parameter settings during observation, and performs image processing automatically.​​ Extensive Functionality • Capture sharp images with optical microscopy to SPM microscopy modes​ Various Support Functionality Achieves Fast Observation​ • High-throughput observation and fast physical property mapping​ SPM-8100FM​​​​​ High Resolution • Noise in air and liquids is reduced to 1/20 that of existing methods.​ ​​​• Achieves the performance level of a vacuum-type SPM, even in air and liquids. Improved Usability​​ • HT scanner extends observation area and shortens observation times.​ • Dual monitors and signal indication function provide greater flexibility 2. Comparison Table Model​ SPM-9700HT Plus​ SPM-Nanoa​ SPM-8100FM Applications Biology, metals, minerals, ceramics, non-metals, polymer, powders, nanotechnology, thin films, semiconductors, coating films, batteries​ Main function Multifunction​ Multifunction.​ ​ automatic observation High resolution observation​ Max. sample size Φ24×8mm​​ Φ50×8mm​​ Φ35×8mm​​ Noise level​ Standard​ Low​ Extremely low​ Optical axis adjustment​ (laser/detector)​​​ Manual Automatic​​ Manual​ Observation parameter setting​ Automatic​​ Automatic​​ Manual​​​ Observation modes​ Contact ​Dynamic ​Phase​ Force modulation​​ ​ Electronic current​ MFM ​ KPFM​ ​ PFM ​ STM​ FM-AFM​ Observation in liquid *​ Physical property mapping function (ZXY scanning)​ Elastic modulus/​Adhesion High-speed mapping​ Elastic modulus/​Adhesion​ High-speed mapping​ Hydration/solvation measurement​​ SPM-9700HT​ Plus SPM-Nanoa​ SPM-8100FM *The functionality of SPM-9700HT is available on a made to order basis. 3. Videos SPM-9700HT High-Throughput Scanner Surface Analysis SPM-Nanoa Scanning Probe Microscope/Atomic Force Microscope Surface Analysis

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