Polarized Zeeman Atomic Absorption Spectrophotometer Graphite Model ZA4700

Description

Hitachi offers high-precision background correction and high-sensitivity measurement by employing the polarized Zeeman correction method alongside the dual detector method. The addition of a new rapid sequential mode (supports the flame method) makes it possible to perform even higher throughput analysis, allowing for fast, precise, and highly reproducible measurements in a variety of fi elds, including research and quality management.